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Grace Scientific Corporation

GSC-PE-504 - Variation of electrical conductivity with temperature in Semiconductors

GSC-PE-504 - Variation of electrical conductivity with temperature in Semiconductors

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Variation of Electrical Conductivity with Temperature in Semiconductors

1.General Features
•Designed with necessary safety precautions
•Easy-to-understand circuit arrangement for learners
•Onboard voltage, current, and temperature measurement facilities
•PC interfacing for data acquisition and analysis
•Supported with user manuals, experiment manuals, installation documentation, and training materials in either printed or electronic format
2.Experimental Capabilities
•Determination of Energy Bandgap of semiconductor materials
•Study of Energy Bandgap Measurement Software Window
•Observation of voltage, current, and temperature variations during experiments
3.Technical Specifications
•DC Power Supply:
o+12–15 V, 2–2.5 A
o+5–6 V, 2–2.6 A
•Diode: PN junction Germanium diode
•Switch: 1 pole, 2 way switch for circuit selection
•Display: 16 × 2 LCD display
•Measurement Ranges:
oVoltage: 0–15 V
oCurrent: 0–50 μA (approx.)
oTemperature: 0–60°C
•Oven Assembly:
oHeight: ~77 mm
oWidth: ~74 mm
oHeating coil: Nichrome wire
•Mechanical Specifications:
oDimensions: ~345 × 110 × 24 mm
oWeight: Suitable for laboratory bench-top use
•Power Requirements: Operates from mains supply 90–275 V AC, 50 Hz
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