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Grace Scientific Corporation
GSC-PE-481 - Determination Of Energy Gap Of A Semiconductor
GSC-PE-481 - Determination Of Energy Gap Of A Semiconductor
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Specifications:-
Energy Gap of a Semiconductor Experiment
A. Semiconductor Instrumentation and Measurement Unit
The apparatus shall be a laboratory-grade semiconductor instrumentation and measurement unit suitable for determining the energy gap of a semiconductor using the temperature dependence of the reverse saturation current of a p-n junction diode. The unit shall conform to the following minimum requirements:
•Constant Current Source: High-stability, low-noise, solid-state constant-current source with continuously variable current control up to 200 mA minimum.
•Digital Current Measurement: Built-in digital panel meter for current measurement with a range of at least 0–200 mA, resolution of 0.1 mA or better, and accuracy of ±0.5% or better.
•Digital Voltage Measurement: Built-in digital panel meter with a voltage measurement range of at least 0–2 V, resolution of 1 mV or better, and accuracy of ±0.5% or better.
•Semiconductor Sample: Semiconductor p-n junction diode suitable for energy-gap determination, using Silicon (Si) or Gallium Arsenide (GaAs) or equivalent semiconductor material. The diode shall be pre-mounted in a sealed, heat-resistant probe/test housing with suitable electrical terminals for safe and reliable connection.
•Construction: The unit shall be suitable for repeated laboratory use and shall incorporate appropriate electrical protection and clearly identified input/output terminals.
•Application: The instrument shall facilitate measurement of the relevant electrical parameters of the semiconductor sample over the required temperature range for determination of the semiconductor energy gap.
B. Digital Thermometer with Temperature Probe
•Instrument Type: Digital thermometer with a suitable wired temperature probe, suitable for laboratory measurement of semiconductor sample temperature.
•Temperature Range: Capable of measuring temperatures up to at least 300°C.
•Display: Digital LCD or equivalent display providing clear temperature indication.
•Sensor Probe: Durable stainless-steel temperature sensor probe suitable for the specified temperature range.
•Functions: The thermometer shall include Auto-OFF or equivalent power-saving function.
•Operation: Suitable for continuous temperature monitoring during the experiment.
C. Electric Heating Kettle
•Type: Electric heating kettle/container suitable for controlled heating of the semiconductor sample assembly during the experiment.
•Capacity: Minimum 1 litre.
•Heating Power: Integrated electric heating element rated at minimum 1000 W.
•Construction: Heat-resistant construction suitable for repeated laboratory use.
•Heating Arrangement: Suitable for accommodating the semiconductor probe/sample assembly and temperature probe as required for the experiment.
•Safety: The kettle shall incorporate appropriate electrical insulation and basic safety features suitable for laboratory operation.
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