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Grace Scientific Corporation

GSC-PE-433 - Magneto-Resistance Of The Semiconductors

GSC-PE-433 - Magneto-Resistance Of The Semiconductors

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Magnetoresistance of Semiconductors – Experimental Setup

1.General Description
•Designed to study magnetoresistance effect in semiconductor samples using the four-probe method
•Enables measurement of variation in sample resistance with applied magnetic field and verification of magnetoresistance phenomenon
2.Components
•Ge semiconductor sample
•Four-probe arrangement
•Electromagnet
•Constant current power supply
•Digital millivoltmeter
•Digital gaussmeter
3.Digital Millivoltmeter
•Measurement range: 0–200 mV
•Minimum resolution: 100 µV
•Accuracy: better than ±0.1% of reading
4.Constant Current Source
•Output: 0–20 mA
•Resolution: 10 µA
•Built-in protection against sample burn-out
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